In-situ characterization and control of MBE growth of III-V nanostructures by means of optical techniques at Imm

Il 13/06/2016 ore 11.00 - 12.30

Sala A - 1° Piano
Istituto dei materiali per l'elettronica ed il magnetismo
Parco Area delle Scienze 37/A
43124 Parma

Seminario del Prof. Emeritus Fernando Briones, dell' Istituto Imm-Csic di Madrid, dal titolo 'In-situ characterization and control of MBE growth of III-V nanostructures by means of optical techniques at Imm'.

RHEED is the most useful and well-known in-situ monitoring and control technique during MBE growth of nanostructures. Optical techniques, besides the popular IR pyrometry, are still rarely used due to their complexity, high commercial cost and need of stable transparent windows. In this talk we will describe, and show particular applications, of the implementation at Imm of a set of original and simple optical techniques that contribute to monitor in real time important growth parameters such as surface chemical composition and stoichiometry, accumulated and relaxation of mismatch and interfacial strains during growth of III-V multilayers, QDs nanostructures and finally, novel phenomena related to the surface reaction and incorporation kinetics of molecular species.

Organizzato da:
IMEM-CNR Parma

Referente organizzativo:
Frigeri Paola
CNR - Istituto dei materiali per l'elettronica ed il magnetismo
paola.frigeri@cnr.it
segreteria-imem@imem.cnr.it

Modalità di accesso: ingresso libero