Microwave irradiation as an alternative source for conventional annealing: a study of pure TiO2, NiTiO3, CdTiO3 thin films by a sol-gel process for electronic applications (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Microwave irradiation as an alternative source for conventional annealing: a study of pure TiO2, NiTiO3, CdTiO3 thin films by a sol-gel process for electronic applications (Articolo in rivista) (literal)

Anno

• 2006-01-01T00:00:00+01:00 (literal)

Alternative label

• Phani, AR; Santucci, S (2006)
  Microwave irradiation as an alternative source for conventional annealing: a study of pure TiO2, NiTiO3, CdTiO3 thin films by a sol-gel process for electronic applications
  
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Phani, AR; Santucci, S (literal)

Pagina inizio

• 6965 (literal)

Pagina fine

• 6978 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 18 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Univ Aquila, INFM, I-67010 Coppito, Italy; Univ Aquila, Dept Phys, I-67010 Coppito, Italy (literal)

Titolo

• Microwave irradiation as an alternative source for conventional annealing: a study of pure TiO2, NiTiO3, CdTiO3 thin films by a sol-gel process for electronic applications (literal)

Abstract

• The lower temperature and shorter timescale for microwave irradiation may be ascribed to the activating and facilitating effect of microwaves on solid-phase diffusion. Using the microwave-heating process, it is possible to achieve enhanced mechanical properties such as greater hardness, improved scratch resistance, and structure texturing. In the present investigation, thin films of pure TiO2 and their respective perovskite-structured thin films, namely NiTiO3 and CdTiO3, have been prepared by simple and cost-effective sol-gel processing on Si(100) substrates and subjected to irradiation with different microwave powers for 10 min. X-ray diffraction (XRD), scanning electron microscopy (SEM) and x-ray photoelectron spectroscopy (XPS) techniques have been employed to characterize the structural, morphological and elemental composition of the films. It is evident that there is a dramatic change in the structural and morphological properties of the films irradiated in microwaves compared to conventional annealing at high temperature. A plausible mechanism for the formation of the anatase phase of TiO2 and perovskite structures with a rhombohedral phase formation at low microwave powers has also been discussed. This new innovative microwave heating could open a door for advanced technologies to cut process costs in the post-treatment of materials. (literal)

Prodotto di

• Materiali nanostrutturati di ossidi metallici e altri semicondutttori per la sensoristica e applicazioni avanzate (MD.P05.015.001) (Modulo)

Autore CNR

• SANDRO SANTUCCI (Unità di personale esterno)

Insieme di parole chiave

• Parole chiave di "Microwave irradiation as an alternative source for conventional annealing: a study of pure TiO2, NiTiO3, CdTiO3 thin films by a sol-gel process for electronic applications" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• SANDRO SANTUCCI (Unità di personale esterno)

Prodotto

• Materiali nanostrutturati di ossidi metallici e altri semicondutttori per la sensoristica e applicazioni avanzate (MD.P05.015.001) (Modulo)

Insieme di parole chiave di

• Parole chiave di "Microwave irradiation as an alternative source for conventional annealing: a study of pure TiO2, NiTiO3, CdTiO3 thin films by a sol-gel process for electronic applications" (Insieme di parole chiave)