Structural characterization of nanocrystalline lanthanum oxyfluoride films obtained by Chemical Vapor Deposition (Articolo in rivista)

Type
Label
  • Structural characterization of nanocrystalline lanthanum oxyfluoride films obtained by Chemical Vapor Deposition (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • D. Barreca, E. Bontempi, L.E. Depero, C. Maragno, E. Tondello, P. Zanola (2007)
    Structural characterization of nanocrystalline lanthanum oxyfluoride films obtained by Chemical Vapor Deposition
    in Journal of nanoscience and nanotechnology (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • D. Barreca, E. Bontempi, L.E. Depero, C. Maragno, E. Tondello, P. Zanola (literal)
Pagina inizio
  • 2741 (literal)
Pagina fine
  • 2747 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 7 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 7 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1: ISTM-CNR and INSTM, Department of Chemistry, University of Padova, Via Marzolo, 1-35131 Padova, Italy 2,3,6: INSTM and Chemistry for Technologies Laboratory, Brescia University, Via Branze, 38-25123 Brescia, Italy 4,5: Department of Chemistry, University of Padova and INSTM, Via Marzolo, 1-35131 Padova, Italy (literal)
Titolo
  • Structural characterization of nanocrystalline lanthanum oxyfluoride films obtained by Chemical Vapor Deposition (literal)
Abstract
  • This study is devoted to a thorough structural and microstructural characterization of nanophasic LaOF-based thin films. The coatings were synthesized by Chemical Vapor Deposition (CVD) onto Si(100) substrates at growth temperatures between 250 and 500 ?C, using La(hfa)3 ·diglyme (Hhfa= 1,1,1,5,5,5-hexafluoro-2,4-pentanedione; diglyme = bis(2-methoxyethyl)ether) as both La and F molecular source under nitrogen+wet oxygen atmospheres. The system structure and microstructure were investigated by Glancing Incidence X-ray Diffraction (GIXRD) and X-ray microdiffraction. The most relevant sample features, with particular attention to the phase composition as a function of the synthesis conditions, are critically discussed. (literal)
Prodotto di
Autore CNR

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
data.CNR.it