Consiglio Nazionale delle Ricerche

Tipo di prodottoArticolo in rivista
TitoloOn the Differential Non-Linearity of Time-To-Digital Converters
Anno di pubblicazione2001
Formato-
Autore/iF. Baronti, L. Fanucci, D. Lunardini, R. Roncella, R. Saletti
Affiliazioni autori1 Universita' di Pisa, 2 CNR, 3 Universita' di Pisa, 4 Universita' di Pisa, 5 Universita' di Pisa
Autori CNR e affiliazioni
  • LUCA FANUCCI
Lingua/e-
AbstractA theoretical analysis of the effects of the delay-line differential nonlinearity (DNL) on the typical performance parameters of high-resolution time-to-digital converters (TDCs) based on delay-locked-loop (DLL) delay lines has been developed. The theoretical study is based on the knowledge of the delay-line nonlinearity values that can be measured, with the desired precision, by means of a statistical code-density test. In particular, the effects on the TDC time resolution and error standard deviation curve as a function of the measured time interval are investigated. An a posteriori linearization technique, consisting in a proper correction of the TDC readouts, is then analyzed and its advantages are theoretically demonstrated. Finally, the theoretical results are superimposed on experimental data coming from a real TDC. The measured deviations from the ideal behavior are thus justified and can just be ascribed to the delay-line nonlinearity.
Lingua abstract-
Altro abstract-
Lingua altro abstract-
Pagine da2424
Pagine a2431
Pagine totali-
RivistaIEEE transactions on nuclear science
Attiva dal 1963
Editore: Professional Technical Group on Nuclear Science, - New York, N.Y.
Paese di pubblicazione: Stati Uniti d'America
Lingua: inglese
ISSN: 0018-9499
Titolo chiave: IEEE transactions on nuclear science
Titolo proprio: IEEE transactions on nuclear science.
Titolo abbreviato: IEEE trans. nucl. sci.
Titoli alternativi:
  • Transactions on nuclear science
  • Nuclear science
  • Nuclear medical and imaging sciences (NMIS)
Numero volume della rivista48
Fascicolo della rivista-
DOI-
Verificato da referee-
Stato della pubblicazione-
Indicizzazione (in banche dati controllate)-
Parole chiaveTDC, delay lines, VLSI
Link (URL, URI)-
Titolo parallelo-
Data di accettazione-
Note/Altre informazioni-
Strutture CNR
  • IEIIT — Istituto di elettronica e di ingegneria dell'informazione e delle telecomunicazioni
Moduli CNR-
Progetti Europei-
Allegati

    Dati storici
    I dati storici non sono modificabili, sono stati ereditati da altri sistemi (es. Gestione Istituti, PUMA, ...) e hanno solo valore storico.
    Area disciplinareElectrical & Electronics Engineering
    Area valutazione CIVRScienze e tecnologie per una società dell'informazione e della comunicazione
    Rivista ISIIEEE TRANSACTIONS ON NUCLEAR SCIENCE [43692J0]
    Descrizione sintetica del prodottoA theoretical analysis of the effects of the delay-line differential nonlinearity (DNL) on the typical performance parameters of high-resolution time-to-digital converters (TDCs) based on delay-locked-loop (DLL) delay lines has been developed. The theoretical study is based on the knowledge of the delay-line nonlinearity values that can be measured, with the desired precision, by means of a statistical code-density test. In particular, the effects on the TDC time resolution and error standard deviation curve as a function of the measured time interval are investigated. An a posteriori linearization technique, consisting in a proper correction of the TDC readouts, is then analyzed and its advantages are theoretically demonstrated. Finally, the theoretical results are superimposed on experimental data coming from a real TDC. The measured deviations from the ideal behavior are thus justified and can just be ascribed to the delay-line nonlinearity.