@prefix pubblicazioni: . @prefix unitaDiPersonaleInterno: . @prefix prodotto: . unitaDiPersonaleInterno:MATRICOLA16944 pubblicazioni:autoreCNRDi prodotto:ID52038 . @prefix prodottidellaricerca: . @prefix istituto: . istituto:CDS087 prodottidellaricerca:prodotto prodotto:ID52038 . @prefix modulo: . modulo:ID4209 prodottidellaricerca:prodotto prodotto:ID52038 . @prefix rdf: . @prefix retescientifica: . prodotto:ID52038 rdf:type retescientifica:ProdottoDellaRicerca , prodotto:TIPO1101 . @prefix rdfs: . prodotto:ID52038 rdfs:label "Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators (Articolo in rivista)"@en . @prefix xsd: . prodotto:ID52038 pubblicazioni:anno "2005-01-01T00:00:00+01:00"^^xsd:gYear ; pubblicazioni:doi "10.1016/j.elspec.2004.06.016"^^xsd:string . @prefix skos: . prodotto:ID52038 skos:altLabel "
Paparazzo E. (2005)
Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators
in Journal of electron spectroscopy and related phenomena (Print)
"^^rdf:HTML ; pubblicazioni:autori "Paparazzo E."^^xsd:string ; pubblicazioni:paginaInizio "219"^^xsd:string ; pubblicazioni:paginaFine "231"^^xsd:string ; pubblicazioni:altreInformazioni "This article appears in a Special Issue of the journal of which I was the Guest (and sole) Editor. The details of the Special Issue are as follows: \n\\\"Electron energy loss spectroscopy in the electron microscope\\\" Journal of Electron Spectroscopy and Related Phenomena, Vol. 143 (2005) 41-257."^^xsd:string ; pubblicazioni:numeroVolume "143"^^xsd:string . @prefix ns11: . prodotto:ID52038 pubblicazioni:rivista ns11:ID350101 ; skos:note "ISI Web of Science (WOS)"^^xsd:string ; pubblicazioni:affiliazioni "ISM - CNR"^^xsd:string ; pubblicazioni:titolo "Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators"^^xsd:string ; prodottidellaricerca:abstract "The potential of reflected electron energy loss microscopy (REELM) are tested in surface and interface studies of metals, semiconductors and insulators. We present spectroscopic analyses of loss signals occurring at 5\u009630 eV of the elastic peak, and microscopic analyses based on the same signals performed via spot mode, as well as via linescanning and imaging modes. Materials investigated include a UHV cleaved InSb surface, InP/SiO2 and GaAs/Au systems, W tips for use in an STM microscope, a ZrO2 single crystal, and an archaeological bronze covered with a thick patina.\n\nAdvantages and shortcomings of REELM are outlined against the diagnostic value of parallel results obtained by scanning Auger microscopy (SAM) techniques. Although comparatively poor focussing powers preclude the attainment of high spatial resolution, and spectral interference problems may hinder the chemical characterization of multi-phase materials, REELM features unique capabilities. Among others, these include a chemical contrast that is much superior to that of SAM, the possibility of characterizing the coverage distribution of adlayer surface species, as well as of investigating the microchemistry of insulators\u0092 surfaces. The first application of REELM in the analysis of archaeological materials is presented."@en ; prodottidellaricerca:prodottoDi modulo:ID4209 , istituto:CDS087 ; pubblicazioni:autoreCNR unitaDiPersonaleInterno:MATRICOLA16944 . @prefix parolechiave: . prodotto:ID52038 parolechiave:insiemeDiParoleChiave . ns11:ID350101 pubblicazioni:rivistaDi prodotto:ID52038 . parolechiave:insiemeDiParoleChiaveDi prodotto:ID52038 .